The In-Circuit Test (ICT) is still the most widely used test procedure for testing electronic boards.
During an ICT, analogous components (resistance, capacity, inductivity, diodes, transistors etc.) as well as complex digital components can be tested.
The In-Circuit-Test allows a very short test time (= high throughput of components) compared to other test procedures (e.g Flying Probe) while being able to cover most parts of a test.
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